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M. K. Bhattacharyya R. J. Davidson H. S. Gill Hewlett-Packard Laboratories |
Bias Scheme Analysis of Shielded MR Heads for Rigid Disk RecordingBiasing schemes for MR heads for use at high areal densities, O(108 bits/in.2), longitudinal recording, are reviewed. By use of the finite element analysis, a number of important design parameters are examined including the transfer function and the peak shift for each biasing scheme. We show that the roll-off peak shift and linearity characteristics are dependent on the type of bias scheme. |
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